A magnetic force microscope (MFM) with integrated 3D magnetic field generator module
We thank the TUM Insitute for Advanced Study for funding the MFM instrument within the Start-up Support Nanomagnetic Computing.
A variable ﬁeld module in closed loop operation, generating both pulsed and constant 3D
vector ﬁelds in the scanning range of a magnetic force microscope (MFM) for characteriza-
tion of nanomagnetic logic devices (NML) was developed at LTE. In the setup, the sample is positioned
above the air gap at which the generated ﬁeld vector is homogeneous in the AFM scanning
area of 100 µm · 100 µm. Stray-ﬁeld sensing at the pole pieces enables closed loop opera-
tion for all three ﬁeld-axes guaranteeing settling times < 20 ms over the full amplitude range
of ± 1000 Oe (pulsed mode) and ± 400 Oe (constant-mode). The compact design (height =
47 mm) ﬁts without modiﬁcation below the tip scanning unit of the microscope and hence is
viable for commercially available tip-scanners.
Figure 1) Cross-section of the MFM field-module as implemented in a commercial MFM microscope.
Figure 2) Field-generator module and sample mount as implemented into the Bruker AXS Dimension Icon tip-scanner.
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