Lehrstuhl für Schaltungsentwurf
Technische Universität München (TUM) - Arcisstr. 21 - 80333 München


Reliability of Microelectronic Components


Microelectronic Components have penetrated a large variety of application areas. This trend continues by scaling down dimensions of structures and devices, which allows further increase of functionality in smaller volumes of electronic components and systems at favourable cost. However this is accompanied by increasing requirements and expectations concerning their safe function under the intended conditions of application, i.e. their reliability.

This lecture treats the procedures and their physical basis for assuring the reliability of components.

General Informations

The lecture "Reliability of Microelectronic Components" will be held in english!

Lecture terms

Wednesday, Room EI N 5325 , 15.00 – 16.30 h
frequency : every 2 weeks, see TumOnline for the detailed time table.


is going to take place on 15.02.2017 at 14.30, Room EI N 5325

There will be a 30-minute written part and a 30-minute oral exam. The oral exams will be on the same day shortly after the written part.


Dr.-Ing. W. Gerling (formerly Siemens Semiconductors / Infineon Technologies: Reliability Engineering, Failure Analysis, Quality Management)


Grazvydas Ziemys

Lecture Documents

The lecture documents can be found here.